• DocumentCode
    1887771
  • Title

    Improved methods of extracting area-like information from CFE current-voltage data

  • Author

    Forbes, Richard G.

  • Author_Institution
    Dept. of Electron. Eng., Univ. of Surrey, Guildford, UK
  • fYear
    2015
  • fDate
    13-17 July 2015
  • Firstpage
    70
  • Lastpage
    71
  • Abstract
    This conference poster reports two improved methods of extracting area-like information from measured current-voltage [im(Vm)] characteristics for cold field electron emission (CFE). Results are valid only if the emission situation is orthodox. These methods: (a) confirm “by experiment” the long-held theoretical expectation that in CFE theory the Schottky-Nordheim (SN) barrier is a better physical model than the exactly triangular (ET) barrier; (b) imply that SN-barrier-related equations should be used to interpret im(Vm) measurements on large-area field emitters (LAFEs); and (c), for emitters exhibiting orthodox behavior, allow area-based information to be reliably extracted as part of emitter characterization. One of the methods might conceivably be useful as a technique for initial investigations into non-orthodox emission.
  • Keywords
    Schottky barriers; electric current measurement; electron field emission; voltage measurement; CFE current-voltage data; CFE theory; ET barrier; LAFE; SN-barrier-related equations; Schottky-Nordheim barrier; area-like information; cold field electron emission; current-voltage characteristics; exactly triangular barrier; large-area field emitters; nonorthodox emission; Area measurement; Current measurement; Data mining; Fitting; Mathematical model; Reliability; Tin; Field electron emission; Fowler-Nordheim plots; formal area efficiency; formal emission area; orthodox current-voltage data analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2015 28th International
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4673-9356-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2015.7225536
  • Filename
    7225536