• DocumentCode
    1887909
  • Title

    Online Machining Process Monitoring Using Wavelet Transform and SPC

  • Author

    Shi, Dongfeng ; Axinte, Dragos A. ; Gindy, Nabil N.

  • Author_Institution
    Sch. of Mech., Mater. & Manuf. Eng., Nottingham Univ.
  • fYear
    2006
  • fDate
    24-27 April 2006
  • Firstpage
    2081
  • Lastpage
    2086
  • Abstract
    A new online machining process monitoring system composing of several interconnected packages has been developed in LabVIEW environment. In this system, triggering and cross-correlation technique is introduced to align sensory signals acquired from different trials. The wavelet and short time Fourier transform is further explored to decompose sensory signals and extract features of tool malfunctions in machining processes. Univariate and multivariate statistical process monitoring techniques are proposed to construct the thresholds of free-malfunction machining zone. Experimental results obtained from the extensive broaching trials show that proposed techniques and monitoring system is effective to detect tool wear and construct thresholds
  • Keywords
    Fourier transforms; computerised monitoring; fault diagnosis; feature extraction; machining; signal processing; statistical process control; virtual instrumentation; wavelet transforms; LabVIEW; SPC; broaching trials; crosscorrelation technique; feature extraction; free-malfunction machining zone; interconnected packages; machining process monitoring system; online machining process monitoring; sensory signal alignment; sensory signal decomposition; short time Fourier transform; statistical process monitoring; tool malfunctions; tool wear detection; triggering; wavelet transform; Condition monitoring; Data acquisition; Feature extraction; Finishing; Machining; Manufacturing processes; Packaging machines; Process control; Signal processing; Wavelet transforms; LabVIEW; Process monitoring; Statistical process control; Wavelet;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
  • Conference_Location
    Sorrento
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-9359-7
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2006.328461
  • Filename
    4124724