DocumentCode :
1888070
Title :
An SVM Approach to Crack Shape Reconstruction in Eddy Current Testing
Author :
Bernieri, Andrea ; Ferrigno, Luigi ; Laracca, Marco ; Molinara, Mario
Author_Institution :
DAEIMI, Cassino Univ.
fYear :
2006
fDate :
24-27 April 2006
Firstpage :
2121
Lastpage :
2126
Abstract :
Nondestructive testing techniques for diagnosis in solid materials can be carried out in three steps: defect detection, location and characterization. The actual solutions allow defect detection and location, but the defect characterization in terms of exact determination of the shape and dimension is still an open question. The present paper proposes a methodology for the reliable estimation of crack shape and dimensions in conductive materials using an integrate eddy current and support vector machine based approach implemented in a suitable measurement station. After design and tuning stages, an experimental validation phase carried out on a number of specimen with different known crack confirms the goodness of the proposed approach
Keywords :
crack detection; eddy current testing; electrical conductivity; materials testing; signal processing; support vector machines; SVM approach; conductive materials; crack shape reconstruction; defect characterization; defect detection; defect location; eddy current testing; measurement station; nondestructive testing; signal processing; solid material diagnosis; Conducting materials; Conductivity measurement; Current measurement; Eddy current testing; Eddy currents; Materials reliability; Nondestructive testing; Shape measurement; Solids; Support vector machines; eddy current testing; nondestructive testing; signal processing; support vector machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2006. IMTC 2006. Proceedings of the IEEE
Conference_Location :
Sorrento
ISSN :
1091-5281
Print_ISBN :
0-7803-9359-7
Electronic_ISBN :
1091-5281
Type :
conf
DOI :
10.1109/IMTC.2006.328502
Filename :
4124733
Link To Document :
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