DocumentCode
1888417
Title
Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit
Author
Meterelliyoz, Mesut ; Goel, Ankush ; Kulkarni, Jaydeep P. ; Roy, Kaushik
Author_Institution
Intel, Hillsboro, OR, USA
fYear
2010
fDate
7-11 Feb. 2010
Firstpage
186
Lastpage
187
Abstract
We design a low-voltage high-sensitivity random-process-variations sensor using an on-chip calibration circuit for improved accuracy. The sensor features a replica-biasing circuit that compensates global PVT variations and maintains sensitivity for robust operation. Measurement results from 90 nm test hip demonstrate the effectiveness of the sensor.
Keywords
calibration; electric sensing devices; integrated circuit testing; low-power electronics; random processes; global PVT variations; on-chip calibration circuit; random process variations sensor; replica bias circuit; robust low voltage high sensitivity sensor; Calibration; Circuits; Low voltage; Random processes; Robustness; Semiconductor device measurement; Sensor phenomena and characterization; Switches; Testing; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Conference_Location
San Francisco, CA
ISSN
0193-6530
Print_ISBN
978-1-4244-6033-5
Type
conf
DOI
10.1109/ISSCC.2010.5433991
Filename
5433991
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