• DocumentCode
    1888509
  • Title

    In situ delay-slack monitor for high-performance processors using an all-digital self-calibrating 5ps resolution time-to-digital converter

  • Author

    Fick, David ; Liu, Nian ; Zhiyoong Foo ; Fojtik, Matthew ; Jae-sun Seo ; Sylvester, Dennis ; Blaauw, D.

  • Author_Institution
    Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2010
  • fDate
    7-11 Feb. 2010
  • Firstpage
    188
  • Lastpage
    189
  • Abstract
    We present a minimally invasive in situ delay-slack monitor that directly measures the timing margins on critical timing signals, allowing margins due to both global and local PVT variations to be removed.
  • Keywords
    convertors; microprocessor chips; 5ps resolution time-to-digital converter; all-digital time-to-digital converter; high-performance processors; in situ delay-slack monitor; self-calibrating time-to-digital converter; timing margin; timing signals; Calibration; Capacitors; Clocks; Counting circuits; Delay; Monitoring; Pulse measurements; Sampling methods; Timing; Virtual colonoscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4244-6033-5
  • Type

    conf

  • DOI
    10.1109/ISSCC.2010.5433996
  • Filename
    5433996
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1888509