• DocumentCode
    1888548
  • Title

    A microcontroller-based PVT control system for a 65nm 72Mb synchronous SRAM

  • Author

    Eid, S.T. ; Whately, Morgan ; Krishnegowda, Sandeep

  • Author_Institution
    Cypress Semicond., San Jose, CA, USA
  • fYear
    2010
  • fDate
    7-11 Feb. 2010
  • Firstpage
    184
  • Lastpage
    185
  • Abstract
    We present a manufacturable scheme for managing PVT variations and controlling speed and power consumption by using an on-chip microcontroller and a temperature sensor. The system varies body-bias and power supplies of the memory core and periphery logic independently. The circuit occupies 0.32 mm2 (0.4%) of a 72 Mb SRAM test-chip in a 65 nm CMOS process.
  • Keywords
    CMOS digital integrated circuits; SRAM chips; microcontrollers; temperature sensors; CMOS process; microcontroller-based PVT control system; on-chip microcontroller; periphery logic; power consumption; size 65 nm; storage capacity 72 Mbit; synchronous SRAM; temperature sensor; Circuit testing; Control systems; Energy consumption; Energy management; Manufacturing; Microcontrollers; Power system management; Random access memory; Temperature control; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4244-6033-5
  • Type

    conf

  • DOI
    10.1109/ISSCC.2010.5433998
  • Filename
    5433998