DocumentCode :
1888550
Title :
Keynote Address III Advancements of microwave diagnostics and their industrial applications
Author :
Mase, A. ; Kogi, Y. ; Ito, N. ; Yokota, Y. ; Miyazaki, K. ; Ogawa, K. ; Takaichi, S. ; Akaki, K. ; Nagae, D. ; Hojo, H. ; Yamaguchi, S. ; Tokuzawa, T. ; Nagayama, Y. ; Kawahata, K. ; Domier, C.W. ; Luhmann, N.C., Jr. ; Park, H.K. ; Kim, K.W.
Author_Institution :
Art, Sci. & Technol. Center for Cooperative Res., Kyushu Univ., Kasuga
fYear :
2008
fDate :
10-12 Nov. 2008
Abstract :
Summary form only given. Progress of microwave and millimeter-wave technologies has made possible advanced diagnostics for application to various fields, such as, plasma diagnostics, radio astronomy, alien substance detection, airborne and spaceborne imaging radars called as synthetic aperture radars, living body measurements, and automobile radars for collision avoidance and adaptive cruise control. Transmission, reflection, scattering, and radiation processes of electromagnetic waves are utilized as diagnostic tools which are classified to active and passive diagnostic systems. In the active system, microwave/millimeter-wave reflectometry (radar) is thought to be essential and most prospective, since it has higher perception accuracy and robustness under the conditions of rain, fog, and snow than conventional technique using laser radar devices. In this report we focus on the technology advances in microwave/millimeter-wave region and the application results of diagnostic systems, specifically by use of imaging technique and ultra-wide band radar technique.
Keywords :
microwave technology; plasma diagnostics; radar; alien substance detection; imaging radars; microwave diagnostics; millimeter-wave technologies; plasma diagnostics; radio astronomy; synthetic aperture radars;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communication Technology, 2008. ICCT 2008. 11th IEEE International Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4244-2250-0
Electronic_ISBN :
978-1-4244-2251-7
Type :
conf
DOI :
10.1109/ICCT.2008.4716164
Filename :
4716164
Link To Document :
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