DocumentCode
1888582
Title
New sensing application to diagnose power semiconductor aging in actuator power drive systems
Author
Ali, Irfan N. ; Ginart, Antonio E. ; Goldin, Jonathan W. ; Kalgren, Patrick W. ; Roemer, Michael J. ; Poll, Scott
Author_Institution
Impact Technol., Rochester, NY, USA
fYear
2012
fDate
3-10 March 2012
Firstpage
1
Lastpage
9
Abstract
This paper presents a new sensing application to diagnose power semiconductor aging in power drive systems. It has been shown previously that device parasitic characteristics change during the aging process which results in detectable changes in their frequency response. This change is manifested in the current signal at very high frequencies. Therefore, using a wideband AC current sensor, high frequency components of the current can be acquired, providing a way to detect device aging.
Keywords
actuators; ageing; electric current measurement; electric drives; frequency response; insulated gate bipolar transistors; power semiconductor devices; actuator power drive systems; frequency response; power semiconductor aging; sensing application; wideband AC current sensor; Aging; Capacitance; Equations; Insulated gate bipolar transistors; Mathematical model; Temperature measurement; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2012 IEEE
Conference_Location
Big Sky, MT
ISSN
1095-323X
Print_ISBN
978-1-4577-0556-4
Type
conf
DOI
10.1109/AERO.2012.6187388
Filename
6187388
Link To Document