Title :
Session 9 overview: Digital circuits & sensors
Author :
Morton, Shannon ; Friedrich, Joshua
Author_Institution :
Icera, Bristol, United Kingdom
Abstract :
No one is safe from the laws of physics. State-of-the-art process scaling is creating panic in the industry, with ever-increasing degrees of variability and aging effects becoming more and more of a concern. No company can risk shipping products that fail in the field, and filtering out such devices during manufacturing costs money. Investors, relax; help is at hand. In line with the conference theme of “Sensing the Future”, this session focuses on a suite of sensors and circuit techniques to extract the highest performance from deep sub-micron technologies. Armed with these circuits, designers have implemented new and innovative methods of keeping devices alive in the field, and operating at their maximum performance.
Keywords :
Aging; Bandwidth; Clocks; Condition monitoring; Delay; Digital circuits; Integrated circuit interconnections; Sensor phenomena and characterization; Technological innovation; Wire;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
978-1-4244-6033-5
DOI :
10.1109/ISSCC.2010.5434003