DocumentCode :
1888728
Title :
Session 9 overview: Digital circuits & sensors
Author :
Morton, Shannon ; Friedrich, Joshua
Author_Institution :
Icera, Bristol, United Kingdom
fYear :
2010
fDate :
7-11 Feb. 2010
Firstpage :
172
Lastpage :
173
Abstract :
No one is safe from the laws of physics. State-of-the-art process scaling is creating panic in the industry, with ever-increasing degrees of variability and aging effects becoming more and more of a concern. No company can risk shipping products that fail in the field, and filtering out such devices during manufacturing costs money. Investors, relax; help is at hand. In line with the conference theme of “Sensing the Future”, this session focuses on a suite of sensors and circuit techniques to extract the highest performance from deep sub-micron technologies. Armed with these circuits, designers have implemented new and innovative methods of keeping devices alive in the field, and operating at their maximum performance.
Keywords :
Aging; Bandwidth; Clocks; Condition monitoring; Delay; Digital circuits; Integrated circuit interconnections; Sensor phenomena and characterization; Technological innovation; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2010 IEEE International
Conference_Location :
San Francisco, CA, USA
ISSN :
0193-6530
Print_ISBN :
978-1-4244-6033-5
Type :
conf
DOI :
10.1109/ISSCC.2010.5434003
Filename :
5434003
Link To Document :
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