Title :
Accelerated environmental stress screening & reliability growth testing of the B-52 infrared camera
Author :
Donovan, Timothy J.
Author_Institution :
Rome Lab., Griffiss AFB, NY, USA
Abstract :
To assure that the final design for the forward looking infrared (FLIR) camera meets the reliability requirements, a specially tailored reliability development growth test (RD/GT) plan has been developed. The author describes the RD/GT plan, how it was developed, its application of accelerated burn-in methods, and its use of methodologies normally associated with environmental stress screening. The RD/GT has two primary objectives: to reduce test time and cost and to provide rapid reliability growth
Keywords :
aircraft instrumentation; cameras; environmental testing; infrared imaging; reliability; B-52 infrared camera; FLIR; accelerated burn-in methods; cost; environmental stress screening; forward looking infrared; methodologies; reliability development growth test; test plan; test time; Aerospace electronics; Aerospace testing; Cameras; Electronic equipment; Electronic equipment testing; Electronic switching systems; Life estimation; Production; Prototypes; Stress;
Conference_Titel :
Reliability and Maintainability Symposium, 1993. Proceedings., Annual
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0943-X
DOI :
10.1109/RAMS.1993.296807
