• DocumentCode
    1889484
  • Title

    Strength and reliability of ceramic modules soldered to flexible cables

  • Author

    Panousis, N.T. ; Prosser, J.F. ; Wang, A.T. ; Yong, Y.N.

  • Author_Institution
    IBM Corp., San Jose, CA, USA
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    377
  • Abstract
    The strength and reliability of soldered interconnections between module pins and flexible cables are discussed. A quantitative measure of the strength of the connection is described. Individual pins were mechanically tested by measuring the force required to push them through the cable, and force and failure mode were recorded. The push-through test was used to determine optimum solder volume for maximum initial strength and to measure degradation following exposure to environmental stresses. The first reliability stress was to store units at constant elevated temperature of 80, 100, and 125°C for up to 8500 h. Analysis of these results was done with a nonlinear regression model. For the dominant mode, the results of this model are: PSi(t,T)=3.05-58×exp(-2629/T )×t0.38i, where PS(t, T) is the push-through strength as a function of time, t , and Kelvin temperature, T. εi represents the random part and is distributed normally with 0 mean. These results give an effective activation energy of 0.6 eV. The second reliability test was to thermally cycle units between -40 and +100°C for up to 1000 cycles. There was no degradation. A simple first-order estimate indicates that this is equivalent to about five lifetimes
  • Keywords
    environmental testing; printed circuit manufacture; reliability; soldering; -40 to 125 C; 8500 h; VLSI; activation energy; ceramic modules soldered to flexible cables; constant elevated temperature; degradation following exposure to environmental stresses; failure mode; force required to push through cable; individual pin testing; maximum initial strength; mechanically tested; model; module pins; nonlinear regression model; optimum solder volume; push-through test; quantitative measure; reliability; reliability stress; reliability test; soldered interconnections; strength; thermal cycling; Ceramics; Degradation; Force measurement; Mechanical cables; Mechanical variables measurement; Pins; Stress measurement; Temperature; Testing; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122217
  • Filename
    122217