DocumentCode
1889484
Title
Strength and reliability of ceramic modules soldered to flexible cables
Author
Panousis, N.T. ; Prosser, J.F. ; Wang, A.T. ; Yong, Y.N.
Author_Institution
IBM Corp., San Jose, CA, USA
fYear
1990
fDate
20-23 May 1990
Firstpage
377
Abstract
The strength and reliability of soldered interconnections between module pins and flexible cables are discussed. A quantitative measure of the strength of the connection is described. Individual pins were mechanically tested by measuring the force required to push them through the cable, and force and failure mode were recorded. The push-through test was used to determine optimum solder volume for maximum initial strength and to measure degradation following exposure to environmental stresses. The first reliability stress was to store units at constant elevated temperature of 80, 100, and 125°C for up to 8500 h. Analysis of these results was done with a nonlinear regression model. For the dominant mode, the results of this model are: PSi(t ,T )=3.05-58×exp(-2629/T )×t0.38+εi, where PS(t , T ) is the push-through strength as a function of time, t , and Kelvin temperature, T . εi represents the random part and is distributed normally with 0 mean. These results give an effective activation energy of 0.6 eV. The second reliability test was to thermally cycle units between -40 and +100°C for up to 1000 cycles. There was no degradation. A simple first-order estimate indicates that this is equivalent to about five lifetimes
Keywords
environmental testing; printed circuit manufacture; reliability; soldering; -40 to 125 C; 8500 h; VLSI; activation energy; ceramic modules soldered to flexible cables; constant elevated temperature; degradation following exposure to environmental stresses; failure mode; force required to push through cable; individual pin testing; maximum initial strength; mechanically tested; model; module pins; nonlinear regression model; optimum solder volume; push-through test; quantitative measure; reliability; reliability stress; reliability test; soldered interconnections; strength; thermal cycling; Ceramics; Degradation; Force measurement; Mechanical cables; Mechanical variables measurement; Pins; Stress measurement; Temperature; Testing; Volume measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122217
Filename
122217
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