Reliability growth of fielded software

Author

Keene, Samuel ; Lane, Christopher

Author_Institution

IBM Federal Syst. Co., Boulder, CO, USA

fYear

1993

fDate

26-28 Jan 1993

Firstpage

360

Lastpage

365

Abstract

A reliability growth model is presented that translates quality measures to time-dependent MTBFs (mean times between failures). Software reliability growth stems from the detection and removal of faults that are latent in the code after delivery. The fielded reliability performance is measured over time; the `noise´ is smoothed; and a general form for the reliability growth profile is generated. The basic reliability growth profile is enhanced to include the impact of code updates, fault recurrence, and usage. It is concluded that the combination of theoretical analysis and actual field data presented should provide key guidance to make operational reliability decisions and determine the support analysis needs of fielded software

Keywords

failure analysis; software reliability; code updates; fault recurrence; fielded software; mean times between failures; reliability growth model; reliability performance; support analysis; time-dependent MTBFs; usage; Application software; Density measurement; Fault detection; Logistics; Programming; Software maintenance; Software performance; Software quality; Software reliability; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability and Maintainability Symposium, 1993. Proceedings., Annual

Conference_Location

Atlanta, GA

Print_ISBN

0-7803-0943-X

Type

conf

DOI

10.1109/RAMS.1993.296829

Filename

296829