Title :
Low-temperature buffer AlInAs/GaInAs on InP HEMT technology for ultra-high-speed integrated circuits
Author :
Brown, A.S. ; Chou, C.S. ; Delaney, M.J. ; Hooper, C.E. ; Jensen, J.F. ; Larson, L.E. ; Mishra, U.K. ; Nguyen, L.D. ; Thompson, M.S.
Author_Institution :
Hughes Res. Lab., Malibu, CA, USA
Abstract :
A report is presented on the development of a planar low-temperature buffer AlInAs/GaInAs on InP high-electron-mobility transistor (HEMT) technology for use in digital and analog integrated circuits. This technology is attractive for circuit applications because of the high achievable f/sub T/ and f/sub max/, low output conductance and gate leakage current, and reduced susceptibility to backgating effects. Two alternative logic families-UFL and SCFL (source-couple FET logic)-were chosen for the realization of digital circuits. Measurements on the UFL ring oscillators exhibited a minimum gate delay of 13 ps with a power dissipation of 1.1 mW/gate at room temperature. The gate delay rose to 25 ps when the power dissipation increased to 3 mW/gate. This gate delay is expected to drop significantly with reductions in diode level-shift series resistance and improvements in transistor f/sub T/. The most complex SCFL circuit tested was a divide-by-eight counter. The SCFL circuits were configured as flip-flops in the divide-by-eight mode. The circuit operated at a maximum clock rate of 12.5 GHz.<>
Keywords :
III-V semiconductors; MMIC; aluminium compounds; counting circuits; digital integrated circuits; field effect integrated circuits; gallium arsenide; indium compounds; integrated circuit technology; linear integrated circuits; substrates; 1.1 to 3 mW; 12.5 GHz; 13 to 25 ps; AlInAs-GaInAs-InP; InP substrates; SCFL circuits; UFL circuits; analog integrated circuits; clock rate; digital integrated circuits; diode level-shift series resistance; divide-by-eight counter; flip-flops; gate delay; gate leakage current; high-electron-mobility transistor; low output conductance; planar HEMT technology; planar low-temperature buffer; power dissipation; reduced susceptibility to backgating effects; ring oscillators; room temperature; semiconductors; source-couple FET logic; ultra-high-speed integrated circuits; Analog integrated circuits; Circuit testing; Delay; HEMTs; Indium phosphide; Integrated circuit technology; Leakage current; Logic circuits; MODFETs; Power dissipation;
Conference_Titel :
Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1989. Technical Digest 1989., 11th Annual
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/GAAS.1989.69313