• DocumentCode
    1889724
  • Title

    Aluminium sputter deposition onto polyimide-coated substrates

  • Author

    Kobayashi, Shigeru ; Okamoto, Akira ; Narizuka, Yasunori ; Arai, Toshiyuki ; Kenmotsu, Akihiro ; Tanaka, Minoru ; Kawasaki, Yoshinao

  • Author_Institution
    Hitachi Ltd., Yokohama, Japan
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    383
  • Abstract
    An aluminium deposition process onto PIQ (polyimide isoindroqui hazoline-dione: Hitachi Chemical)-coated substrates was developed for a continuous cassette-to-cassette sputtering machine. The baking process of the substrates in vacuum was studied for various film thicknesses and heating rates. PIQ releases water vapor upon heating in a vacuum and gives a maximum release rate at around 120°C with a heating rate of 56°C/min. PIQ was found to contain 0.5 wt% water vapor in a clean-room environment. PIQ-coated substrates were found to have a sufficiently stable and high emissivity, and the infrared thermometer was successfully applied. The double electromagnet sputtering cathode has been employed to ensure uniformity and long target life. Aluminium film characterization was done for the specularity, microstructure, and thermal stress
  • Keywords
    VLSI; aluminium; dielectric thin films; integrated circuit technology; metallisation; organic insulating materials; polymer films; sputter deposition; Al sputter deposition; Hitachi Chemical; PIQ-coated substrates; baking process; clean-room environment; continuous cassette-to-cassette sputtering machine; double electromagnet sputtering cathode; film thicknesses; heating rates; long target life; microstructure; multilevel metallisation dielectrics; polyimide interlayer dielectric; polyimide isoindroqui hazoline-dione; polyimide-coated substrates; releases water vapor upon heating; specularity; thermal stress; Aluminum; Cathodes; Chemical processes; Electromagnets; Microstructure; Polyimides; Sputtering; Substrates; Thermal stresses; Water heating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122218
  • Filename
    122218