DocumentCode :
1889729
Title :
Designing surface-mount technology for operational service life
Author :
Bobrowski, Jerome C. ; Murphy, William E.
Author_Institution :
IBM Federal Syst. Co., Owego, NY, USA
fYear :
1993
fDate :
26-28 Jan 1993
Firstpage :
326
Lastpage :
332
Abstract :
In military and space applications, it is not unusual for the temperatures of solder joints and multilayer interconnection boards (MIBs) to cycle between -55° and +95°C. IBM has tested circuit card assemblies (CCA) and established the reliability of leadless chip carrier (LCC) components directly soldered to Kevlar epoxy MIBs, specifically solder joint life and plated-thru-hole (PTH) life, which are not adequately addressed by military specifications. The key is to match the coefficient of thermal expansion (CTE) of the MIB very closely to that of the LCC/SMT (surface mount technology). IBM´s laboratory test data provide the basis for (a) predicting field life from both thermal and vibration perspectives (b) determining whether this type of interconnection will last beyond its useful life (operational service life) requirement for military and space applications, and (c) determining specific material and process controls required to ensure a reliable product
Keywords :
aerospace testing; circuit reliability; life testing; military equipment; printed circuit design; printed circuit testing; process control; soldering; surface mount technology; thermal expansion; vibration measurement; IBM; Kevlar epoxy MIBs; LCC; SMT; circuit card assemblies; coefficient of thermal expansion; design; interconnection; leadless chip carrier; material controls; military specifications; multilayer interconnection boards; operational service life; plated-through-hole life; process controls; solder joint life; space; surface mount technology; vibration; Assembly; Circuit testing; Integrated circuit interconnections; Lead; Life testing; Nonhomogeneous media; Soldering; Space technology; Surface-mount technology; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1993. Proceedings., Annual
Conference_Location :
Atlanta, GA
Print_ISBN :
0-7803-0943-X
Type :
conf
DOI :
10.1109/RAMS.1993.296834
Filename :
296834
Link To Document :
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