DocumentCode :
1889824
Title :
An Unweighted Exhaustive Diagonalization Based Multi-Class Common Spatial Pattern Algorithm in Brain-Computer Interfaces
Author :
Chen, Kui ; Wei, Qingguo ; Ma, Yuhui
Author_Institution :
Dept. of Electron. Eng., Nanchang Univ., Nanchang, China
fYear :
2010
fDate :
25-26 Dec. 2010
Firstpage :
1
Lastpage :
5
Abstract :
In binary brain-computer interfaces (BCI) based on motor imagery, common spatial pattern (CSP) successfully discriminates two-class EEG data. However, low information transfer rate is an intrinsic drawback of binary BCIs that limits their practical applications. It´s essential to extend binary CSP algorithm to multi-class paradigms. In this paper, a new approximate joint diagonalization (AJD) method, named unweighted exhaustive diagonalization with Gauss iterations (UEDGI) is proposed for the extension. The UEDGI based multi-class CSP algorithm is applied to five data sets recorded during motor imagery of left hand, right hand, foot or tongue. The performance of the algorithm is accessed by classification accuracy and convergence speed, and compared with other two multi-class CSP algorithms, one versus one (OVO) and one versus the rest (OVR). Experimental results show that the UEDGI based multi-class CSP performs best in both classification rate and running speed.
Keywords :
Gaussian processes; approximation theory; brain-computer interfaces; electroencephalography; iterative methods; medical signal processing; signal classification; Gauss iterations; approximate joint diagonalization method; brain-computer interfaces; common spatial pattern; motor imagery; multiclass common spatial pattern algorithm; one versus one; one versus the rest; two-class EEG data; unweighted exhaustive diagonalization; Accuracy; Algorithm design and analysis; Approximation algorithms; Classification algorithms; Covariance matrix; Electroencephalography; Joints;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information Engineering and Computer Science (ICIECS), 2010 2nd International Conference on
Conference_Location :
Wuhan
ISSN :
2156-7379
Print_ISBN :
978-1-4244-7939-9
Electronic_ISBN :
2156-7379
Type :
conf
DOI :
10.1109/ICIECS.2010.5677859
Filename :
5677859
Link To Document :
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