DocumentCode :
1890189
Title :
Studies of In and N composition effects on the optical properties and surface morphology of GaInNAs quantum dots grown by rf-plasma assisted MBE
Author :
Yew, K.C. ; Yoon, S.F. ; Sun, Z.Z. ; Ng, T.K. ; Loke, W.K. ; Wang, S.Z. ; Fan, W.J.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Universio, Singapore, Singapore
fYear :
2002
fDate :
2002
Firstpage :
577
Lastpage :
580
Abstract :
Self-assembled GaInNAs quantum dots (QD) were fabricated on GaAs [001] substrate by solid source molecular beam epitaxy (SSMBE) equipped with a RF nitrogen plasma source. The surface morphology was investigated using atomic-force microscopy (AFM), and the photoluminescence (PL) of the QDs was measured at low temperature (5 K). Through these measurements, the effect of indium and nitrogen compositions on the island density, island size, and optical properties were studied. The experiment was carried out with indium and nitrogen composition ranges of 30%-70% and 0.4%-0.8%, respectively. Using high indium composition, an island density of 1×1011/cm2 was obtained in a single layer of GaInNAs QDs. The AFM results showed that the island size of the QDs is in the range of 20-40 nm with an average height of 5-16 nm and the highest island density of 1×1011/cm2 has been achieved. Low temperature (5 K) photoluminescence (PL) wavelength of 1.10 μm to 1.54 μm was detected from these samples.
Keywords :
III-V semiconductors; atomic force microscopy; gallium arsenide; gallium compounds; indium compounds; island structure; molecular beam epitaxial growth; photoluminescence; semiconductor growth; semiconductor quantum dots; surface composition; surface topography; wide band gap semiconductors; 1.10 to 1.54 micron; 20 to 40 nm; 5 K; 5 to 16 nm; GaInNAs; GaInNAs quantum dots; atomic-force microscopy; composition effects; island density; island size; optical properties; photoluminescence; rf-plasma assisted MBE; solid source molecular beam epitaxy; surface morphology; Atom optics; Atomic measurements; Indium; Molecular beam epitaxial growth; Nitrogen; Optical microscopy; Optical surface waves; Photoluminescence; Quantum dots; Surface morphology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials Conference, 2002. IPRM. 14th
ISSN :
1092-8669
Print_ISBN :
0-7803-7320-0
Type :
conf
DOI :
10.1109/ICIPRM.2002.1014494
Filename :
1014494
Link To Document :
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