• DocumentCode
    1890189
  • Title

    Studies of In and N composition effects on the optical properties and surface morphology of GaInNAs quantum dots grown by rf-plasma assisted MBE

  • Author

    Yew, K.C. ; Yoon, S.F. ; Sun, Z.Z. ; Ng, T.K. ; Loke, W.K. ; Wang, S.Z. ; Fan, W.J.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Universio, Singapore, Singapore
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    577
  • Lastpage
    580
  • Abstract
    Self-assembled GaInNAs quantum dots (QD) were fabricated on GaAs [001] substrate by solid source molecular beam epitaxy (SSMBE) equipped with a RF nitrogen plasma source. The surface morphology was investigated using atomic-force microscopy (AFM), and the photoluminescence (PL) of the QDs was measured at low temperature (5 K). Through these measurements, the effect of indium and nitrogen compositions on the island density, island size, and optical properties were studied. The experiment was carried out with indium and nitrogen composition ranges of 30%-70% and 0.4%-0.8%, respectively. Using high indium composition, an island density of 1×1011/cm2 was obtained in a single layer of GaInNAs QDs. The AFM results showed that the island size of the QDs is in the range of 20-40 nm with an average height of 5-16 nm and the highest island density of 1×1011/cm2 has been achieved. Low temperature (5 K) photoluminescence (PL) wavelength of 1.10 μm to 1.54 μm was detected from these samples.
  • Keywords
    III-V semiconductors; atomic force microscopy; gallium arsenide; gallium compounds; indium compounds; island structure; molecular beam epitaxial growth; photoluminescence; semiconductor growth; semiconductor quantum dots; surface composition; surface topography; wide band gap semiconductors; 1.10 to 1.54 micron; 20 to 40 nm; 5 K; 5 to 16 nm; GaInNAs; GaInNAs quantum dots; atomic-force microscopy; composition effects; island density; island size; optical properties; photoluminescence; rf-plasma assisted MBE; solid source molecular beam epitaxy; surface morphology; Atom optics; Atomic measurements; Indium; Molecular beam epitaxial growth; Nitrogen; Optical microscopy; Optical surface waves; Photoluminescence; Quantum dots; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials Conference, 2002. IPRM. 14th
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-7320-0
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2002.1014494
  • Filename
    1014494