DocumentCode
1890321
Title
Textile surface inspection by using translation invariant wavelet transform
Author
Fujiwara, Hisanaga ; Zhang, Zhong ; Toda, Hiroshi ; Kawabata, Hiroaki
Author_Institution
Industrial Technol. Center of Okayama Prefecture, Japan
Volume
3
fYear
2003
fDate
16-20 July 2003
Firstpage
1427
Abstract
It is known that texture can be modeled better using both deterministic and random components. The wavelet transform, which can be computed efficiently, is a well-know multiresolution analysis method. However, when it is applied to texture analysis method. However, then it is applied to texture analysis, the wavelet transform has the problem that the transformed result of the deterministic component of the texture is no longer translation invariant. In this paper, we will constitute 2D RI-spline wavelets, which can be considered to be one variation of complex wavelets, we can obtain translation invariance. Then, we apply the translation invariant 2-D RI-spline wavelets to the automated inspection of textile surfaces. In our approach, first to remove textile textures from textile surfaces we use the 2-D RI-spline wavelets. Once the textural information is removed from textile surfaces, the remaining inspection process becomes a tractable problem, which we can handle using a standard statistical method. The experimental results show that our inspection method is effective for real textile surfaces.
Keywords
image texture; splines (mathematics); statistical analysis; surface texture; textile industry; wavelet transforms; 2D RI-spline wavelets; antisymmetric biorthogonal spline wavelets; inspection process; multiresolution analysis method; random components; textile surface inspection; texture analysis; tractable problem; translation invariance; translation invariant wavelet transform; Image texture analysis; Inspection; Spline; Statistical analysis; Surface texture; Surface waves; Textile technology; Tiles; Wavelet analysis; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence in Robotics and Automation, 2003. Proceedings. 2003 IEEE International Symposium on
Print_ISBN
0-7803-7866-0
Type
conf
DOI
10.1109/CIRA.2003.1222207
Filename
1222207
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