Title :
Design for manufacturability: a path from system level to high yielding chips
Author :
Strojwas, Andrzej J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Abstract :
This tutorial describes a wide spectrum of the Design for Manufacturability (DFM) activities. We start by presenting a new approach to IC design, which takes full advantage of leading edge technology. Then we propose a new methodology for acceleration of yield ramping which accounts for all the dominant yield loss mechanisms and a set of software tools that have been developed to address the yield learning problems. Several real-life examples demonstrate the practical results of employing such a yield ramping strategy.
Keywords :
circuit CAD; circuit optimisation; design for manufacture; integrated circuit design; integrated circuit yield; IC design; design analysis; design for manufacturability; high yielding chips; software tools; system level; yield data analysis; yield diagnosis; yield prediction; yield ramping; Acceleration; Circuit testing; Data analysis; Design for manufacture; Fabrication; Manufacturing processes; Production; Semiconductor device manufacture; Software tools; Time to market;
Conference_Titel :
Design Automation Conference, 2000. Proceedings of the ASP-DAC 2000. Asia and South Pacific
Conference_Location :
Yokohama, Japan
Print_ISBN :
0-7803-5973-9
DOI :
10.1109/ASPDAC.2000.835127