Interferometric processing of TanDEM-X data

Since July 2010, TerraSAR-X and TanDEM-X jointly acquire interferometric data. Starting their common commissioning phase with a so called pursuit monostatic configuration with 3 seconds time lag between the two passes, they were later put in a close formation in October 2010, acting since then as the first freely configurable bistatic SAR interferometer in space. All operational acquisitions were processed from instrument raw data to DEMs from day one of the data taking on by one single processing system: the Integrated TanDEM-X Processor (ITP) (see [1],[2]). Data take analysis, common parameter calculation, synchronization, bistatic focusing, filtering, co-registration, phase unwrapping and geocoding are all performed in one sequence inside this processor. This approach allows a high precision processing by passing all applied corrections and determined parameters from one step to the next. Specifically the geometric & phase accuracy and stability of the instruments, the processor and the auxiliary data (i.e. the millimetric precision of the baseline products) provide an unprecedented level of relative and absolute geometric accuracy in the bistatic operation. While many challenges of bistatic processing of the TanDEM-X data are encountered, the benefits of this single pass acquisition mode can be used to derive additional information from the data itself for further processing and calibration. In this paper, we will outline the bistatic interferometric processing steps of the ITP and focus on the aspects of geometric accuracy in DEM generation.