Title :
Single fault reliability analysis in FPGA implemented circuits
Author :
Jahanirad, Hadi ; Mohammadi, Karim ; Attarsharghi, Pejman
Author_Institution :
Coll. of Electr. Eng., Iran Univ. of Sci. & Technol., Tehran, Iran
Abstract :
Reliability analysis in FPGA implementation of logic circuits is an important issue in designing fault tolerant systems for faulty environments. In this paper an analytical method is developed for analyzing such systems. This method is based on signal probability propagation of faults from the location of appearance to final outputs of circuit. Single fault model is used for the faults occurred in routes and LUTs. In addition reconvergent fan-outs are handled using 16 correlation coefficients propagation approach. Experimental results show a good agreement between this method and Monte Carlo method for reliability analysis of MCNC benchmarks.
Keywords :
Monte Carlo methods; fault diagnosis; fault tolerance; field programmable gate arrays; logic circuits; probability; FPGA implementation; FPGA implemented circuit; MCNC benchmark; Monte Carlo method; correlation coefficient propagation; fault reliability analysis; fault tolerant system; faulty environment; logic circuit; reconvergent fan-outs; signal probability propagation; single fault model; Circuit faults; Correlation; Field programmable gate arrays; Logic gates; Reliability; Switches; Wires; Correlation Coefficient; FPGA; LUT; Reliability; SEU; Signal Probability; Single Fault;
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4673-1034-5
DOI :
10.1109/ISQED.2012.6187473
