DocumentCode :
1890853
Title :
LabVIEW based control software for finger force sensor instrumentation design
Author :
Agraz, Jose ; Pozos, Robert
Author_Institution :
Bioeng. Dept., Univ. of California Los Angeles, Los Angeles, CA, USA
fYear :
2013
fDate :
16-19 Sept. 2013
Firstpage :
1
Lastpage :
6
Abstract :
This report describes National Instruments (NI) LabVIEW software for the control of finger force instrumentation for the quantification of Repetitive Stress Injury (RSI), Carpal Tunnel Syndrome (CTS), or other applications requiring automated data acquisition of applied finger force using resistive type force sensors. The quantification of finger force requires the precise data collection from resistive force sensors for all five fingers and keyboard key switches. This abstract describes how a LabVIEW based software application allows for the precise control over data force collection for all fingers and key switches, while acquiring human subject´s study information, isometric & datalogging finger force, and providing the user with visual force measurements feedback. The implementation of this software provides a fast prototyping for evaluating finger force instrumentation. While no other LabVIEW based software application is available to date for this finger force data collection, our system proved rugged and flexible enough to accommodate fine tuning changes on hardware and software, with a minimum of dead time during usage. The software is available for download at www.joseagraz.com.
Keywords :
data acquisition; force sensors; virtual instrumentation; LabVIEW based control software; automated data acquisition; carpal tunnel syndrome; data force collection; finger force sensor instrumentation design; repetitive stress injury; resistive type force sensors; visual force measurements; Data collection; Force; Force sensors; Instruments; Keyboards; Software; Thumb; Carpal Tunnel Syndrome; Control; Finger; Force; Instrumentation; LabVIEW;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 2013 IEEE
Conference_Location :
Schaumburg, IL
ISSN :
1088-7725
Print_ISBN :
978-1-4673-5681-7
Type :
conf
DOI :
10.1109/AUTEST.2013.6645049
Filename :
6645049
Link To Document :
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