Title :
Thermal analysis of 3D integrated circuits based on discontinuous Galerkin finite element method
Author :
Zjajo, Amir ; Van der Meijs, Nick ; Van Leuken, Rene
Author_Institution :
Circuits & Syst. Group, Delft Univ. of Technol., Delft, Netherlands
Abstract :
Even though vertical 3D integration offers increased device density, reduced signal delay, and design flexibility, heat and thermal concerns are, nevertheless, aggravated. In this context, accurate computation of temperature profile is required to establish thermal design rules governing the feasibility of integration options. Within this framework, a novel methodology based on discontinuous Galerkin finite element method for accurate thermal profile estimation of 3D integrated circuits is proposed. The method is utilized to simulate geometrically complicated physical structures with limited complexity overhead.
Keywords :
Galerkin method; finite element analysis; integrated circuit design; thermal management (packaging); three-dimensional integrated circuits; 3D integrated circuit; discontinuous Galerkin finite element method; temperature profile; thermal design rule; thermal profile estimation; vertical 3D integration; Boundary conditions; Conductivity; Finite element methods; Integrated circuit modeling; Thermal analysis; Thermal conductivity; Three dimensional displays; 3D IC; Adaptive error control; CAD; Multi-layer; Simulation; Thermal analysis;
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4673-1034-5
DOI :
10.1109/ISQED.2012.6187483