Title :
Simulation of Landau quantization effects due to strong magnetic fields in (110) Si hole inversion layers
Author :
Pham, A.T. ; Jungemann, C. ; Meinerzhagen, B.
Author_Institution :
BST, Tech. Univ. Braunschweig, Braunschweig, Germany
Abstract :
Landau quantization due to strong magnetic fields is simulated for (110) Si hole inversion layers. The simulations are based on the self-consistent solution of the 6×6 K⃗·p⃗ Schrodinger equation (SE) and Poisson equation (PE). A new method to solve the 2D K·p SE is presented. The new simulations take into account Landau quantization, Zeeman spin splitting and size quantization at the same time. Oscillations of the density of states at the Fermi level (DF(B) or DF(VG)) are demonstrated. The oscillations of the simulated DF(VG) characteristics are similar to the oscillations that measured transconductance versus gate voltage (gm(VG)) characteristics show for the same samples and identical conditions.
Keywords :
Fermi level; Landau levels; MOSFET; Poisson equation; SCF calculations; Schrodinger equation; Zeeman effect; electronic density of states; elemental semiconductors; inversion layers; silicon; (110)Si hole inversion layer; Fermi level; Landau quantization effects; Poisson equation; Schrodinger equation; Zeeman spin splitting; density of states oscillations; gate voltage; self-consistent solution; size quantization; strong magnetic fields; transconductance; Equations; Filling; Logic gates; Mathematical model; Oscillators; Quantization; Silicon;
Conference_Titel :
Computational Electronics (IWCE), 2010 14th International Workshop on
Conference_Location :
Pisa
Print_ISBN :
978-1-4244-9383-8
DOI :
10.1109/IWCE.2010.5677912