Efficient diagnosis of scan chains with single stuck-at faults

Locating the scan chain fault is a critical step for IC manufacturers to analyze failure for yield improvement. In this paper, we propose a diagnosis scheme to locate the single stuck-at fault in scan chains. Our diagnosis scheme is an improved design to a previously proposed scheme which can diagnose the output of each cell flip-flop in the scan chain. With our scheme, not only the output of each cell flip-flop can be diagnosed, but also the inverse output of each cell flip-flop and the serial input of the scan chain as well. Our proposed diagnosis scheme is efficient and takes (4n+6) clock cycles in the worst case for an n-bit scan chain.