DocumentCode :
1891106
Title :
An ultra-low voltage digitally controlled low-dropout regulator with digital background calibration
Author :
Kim, Yongtae ; Li, Peng
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
fYear :
2012
fDate :
19-21 March 2012
Firstpage :
151
Lastpage :
158
Abstract :
In this paper, we describe a novel ultra-low voltage digitally controlled low-dropout (LDO) voltage regulator offering digitally controllable dynamic voltage scaling (DVS) for near/sub-threshold applications. We eliminate the reference voltage in conventional LDOs and adopt the reference clock that enables the proposed LDO to be controlled digitally. The analog components are replaced by digital counterparts which are able to operate at near/sub-threshold regime. Additionally, a digital background calibration scheme is proposed to minimize the regulated voltage errors due to process, voltage, and temperature (PVL) variations. The proposed LDO has been designed in a 90-nm regular Vt CMOS process and the active area is 0.038-mm2. The LDO can regulate the output voltage from 260-mV to 440-mV, while the input supply voltage is from 380-mV to 500-mV. It delivers 3-mA load current at a 500-mV input and the quiescent current is 30.8-μA. The current and power efficiencies reach 99.0% and 87.1%, respectively. Furthermore, the regulated output voltage of the proposed LDO is tunable digitally in run-time with various step sizes.
Keywords :
CMOS integrated circuits; calibration; low-power electronics; voltage regulators; CMOS process; analog component; current 30.8 muA; digital background calibration scheme; dynamic voltage scaling; near-threshold application; reference voltage elimination; regulated voltage error minimisation; size 90 nm; sub-threshold application; ultra-low voltage digitally controlled low-dropout voltage regulator; voltage 260 mV; voltage 380 mV; voltage 440 mV; voltage 500 mV; Calibration; Clocks; Frequency measurement; Power transistors; Radiation detectors; Voltage control; Voltage measurement; background calibration; digital LDO; digital calibration; digital control; dynamic voltage scaling (DVS); linear regulator; low-dropout (LDO) regulator; sub-threshold; ultra-low voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
ISSN :
1948-3287
Print_ISBN :
978-1-4673-1034-5
Type :
conf
DOI :
10.1109/ISQED.2012.6187488
Filename :
6187488
Link To Document :
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