• DocumentCode
    1891434
  • Title

    Fast delay estimation with buffer insertion for through-silicon-via-based 3D interconnects

  • Author

    Lee, Young-Joon ; Lim, Sung Kyu

  • Author_Institution
    Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2012
  • fDate
    19-21 March 2012
  • Firstpage
    228
  • Lastpage
    335
  • Abstract
    For successful adoption of through-silicon-via-based 3D ICs, delay estimation techniques of 3D interconnects for early design stages are required. The 3D nets may connect gates/macros placed far apart and through-silicon-vias (TSVs) have large parasitic capacitances. Thus, buffers are inserted to reduce interconnect delay. To make good decisions in early design stages, the estimation of buffered delay should be fast and reasonably accurate. However, there has been no buffered delay estimation work for 3D ICs that considers proper delay models and TSV RC parasitics. In this work, we investigate several analytical delay models for 3D net delay estimation. Then, based on analytical formula and our heuristic algorithm, we propose how to estimate the buffered delay for movable TSV cases and fixed TSV cases. The effectiveness of our delay estimation technique is demonstrated with various 3D nets. Compared with the van Ginneken buffer insertion based delay estimation, our estimation provides solutions about 750 times faster with almost the same estimated delay.
  • Keywords
    integrated circuit interconnections; three-dimensional integrated circuits; 3D net delay estimation; TSV RC parasitics; buffer insertion; buffered delay estimation; delay model; heuristic algorithm; parasitic capacitance; through-silicon-via-based 3D IC; through-silicon-via-based 3D interconnect; Capacitance; Delay estimation; Logic gates; Mathematical model; Three dimensional displays; Through-silicon vias; 3D IC; buffer insertion; delay estimation; through-silicon-via;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2012 13th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1948-3287
  • Print_ISBN
    978-1-4673-1034-5
  • Type

    conf

  • DOI
    10.1109/ISQED.2012.6187499
  • Filename
    6187499