• DocumentCode
    1891493
  • Title

    Next generation ATE software

  • Author

    Hooper, Rich

  • Author_Institution
    A Textron Syst. Co., AAI Corp., Hunt Valley, MD, USA
  • fYear
    2013
  • fDate
    16-19 Sept. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    AAI Corporation has been making Automated Test Equipment (ATE) for over three decades. Over that time we have deployed a number of different generations of ATE software. Recently we decided to invest in developing the next generation of software for our test systems. At a high-level, we wanted the software to employ best-in-class Commercial Off-The-Shelf (COTS) elements where possible. Furthermore, we wanted the software to go beyond the traditional view of an isolated test system. To this end, the software model we developed implements the IEEE 1671 “Dot” standards. These IEEE standards provide a mechanism to format and present the different elements of the test system to its different users throughout the organization. This paper overviews the development of our latest generation ATE software and highlights its major components.
  • Keywords
    IEEE standards; automatic test equipment; ATE software; IEEE 1671 Dot standards; automated test equipment; commercial off-the-shelf elements; Built-in self-test; Hardware; Instruments; Relays; Software; Standards; Switches; Automated Test Equipment; IEEE 1671; Self-Test; Switching Software; Test Executive;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 2013 IEEE
  • Conference_Location
    Schaumburg, IL
  • ISSN
    1088-7725
  • Print_ISBN
    978-1-4673-5681-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.2013.6645071
  • Filename
    6645071