Title :
Device- and system-level performance modeling for graphene P-N junction logic
Author :
Pan, Chenyun ; Naeemi, Azad
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Based on the property of angular dependent transmission probability of electrons observed in graphene PN junctions, a modified MUX-based graphene logic device is introduced. A more elaborate resistance model including ON resistance, leakage resistance and contact resistance is given as well as a capacitance model of the device. Compared with Si CMOS switches, MUX-based logic graphene gates have potentially lower output resistances and a smaller device area. Since interconnects play an ever increasing important role in digital circuit, for the first time, module-level and system-level analyses are made for better evaluating the potential performance of graphene logic devices. Based on the analysis of a 32-bit Han-Carlson adder, module-level evaluation has been done and comparison has been made between graphene logic circuits complemented by multilayer graphene interconnects and CMOS logic circuits with Cu/low k interconnects. The results indicate that MUX-based graphene logic circuits can outperform CMOS circuits in terms of both delay and power consumption. Both devices being evaluated are based on the 15nm technology node. For the system-level analysis, the graphene logic system can have 50% higher throughput than its Si CMOS counterpart with the same power density and die size area.
Keywords :
adders; copper; integrated circuit interconnections; logic gates; p-n junctions; CMOS logic circuit; Cu; Han-Carlson adder; MUX-based logic graphene gate; ON resistance; angular dependent transmission probability; capacitance model; contact resistance; device-level performance modeling; digital circuit; elaborate resistance model; graphene P-N junction logic; graphene PN junction; graphene logic circuit; leakage resistance; modified MUX-based graphene logic device; module-level analysis; module-level evaluation; multilayer graphene interconnect; size 15 nm; system-level analysis; system-level performance modeling; word length 32 bit; CMOS integrated circuits; Capacitance; Integrated circuit interconnections; Integrated circuit modeling; Junctions; Logic gates; Resistance; Graphene PN junction; resistance and capacitance model; system-level performance evaluation; transmission probability;
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4673-1034-5
DOI :
10.1109/ISQED.2012.6187504