• DocumentCode
    1891633
  • Title

    An isolation technology for joined tungsten MEMS

  • Author

    Chen, Liang-Yuh ; Santos, Edval J.P. ; MacDonald, Noel C.

  • Author_Institution
    Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
  • fYear
    1993
  • fDate
    7-10 Feb 1993
  • Firstpage
    189
  • Lastpage
    194
  • Abstract
    An isolation technology utilizing a selective chemical vapor deposition (CVD) of tungsten to fabricate released, joined and isolated microelectromechanical structures (MEMS) is presented. The isolation scheme features released tungsten structures that are both mechanically joined and electrically isolated by silicon nitride and offers extra design freedom for micromachining. The technology is used to fabricate an isolated-tungsten, serial-parallel (SP), linear electrostatic, capacitive actuator. The actuator is composed of a series of released silicon nitride hinges. Experiments demonstrate that a controlled large lateral displacement range (e.g., greater than 10 μm) is achieved at modest voltages. Stable stepping motion is a major characteristic of the SP actuator. The fabrication and the operation of this linear actuator are reported
  • Keywords
    chemical vapour deposition; electric actuators; electrostatic devices; masks; metallisation; micromechanical devices; sputter etching; tungsten; Si; Si wafer; Si3N4; W; capacitive actuator; controlled large lateral displacement range; electrically isolated; fabrication; isolation technology; joined MEMS; linear actuator; linear electrostatic; mechanically joined; microactuators; microgripper; micromachining; selective chemical vapor deposition; serial-parallel; stable stepping motion; three-mask process; Chemical technology; Chemical vapor deposition; Electrostatic actuators; Fasteners; Hydraulic actuators; Isolation technology; Micromachining; Micromechanical devices; Silicon; Tungsten;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 1993, MEMS '93, Proceedings An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems. IEEE.
  • Conference_Location
    Fort Lauderdale, FL
  • Print_ISBN
    0-7803-0957-X
  • Type

    conf

  • DOI
    10.1109/MEMSYS.1993.296924
  • Filename
    296924