• DocumentCode
    1891795
  • Title

    Split augmented Hammerstein behavioral model with additional distortion path

  • Author

    Lee, Mun-Woo ; Lee, Yong-Sub ; Kam, Sang-Ho ; Jeong, Yoon-Ha

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang, South Korea
  • fYear
    2010
  • fDate
    10-14 Jan. 2010
  • Firstpage
    176
  • Lastpage
    179
  • Abstract
    This paper proposes the split augmented Hammerstein (SAH) model with an additional distortion path. The error signal between the source signal and the output signal of the augmented Hammerstein (AH) model is employed to enhance the accuracy of the AH model. The 13th memoryless polynomial and a finite impulse response (FIR) filter are used in the memoryless and memory effect subsystems, respectively. The coefficients of FIR filters are obtained by the recursive least square algorithm. To validate the performance of the SAH model, the Doherty power amplifier and a 2-FA WCDMA signal with 10-MHz carrier spacing at 2.14 GHz are employed. The validation results demonstrate that the SAH model can characterize the memory effects as well as the nonlinearity more accurately than the AH model.
  • Keywords
    FIR filters; code division multiple access; least squares approximations; power amplifiers; recursive filters; Doherty power amplifier; FIR filter coefficient; SAH model; WCDMA signal; carrier spacing; distortion path; finite impulse response filter; frequency 10 MHz; frequency 2.14 GHz; memory effect subsystems; memoryless polynomial; recursive least square algorithm; source signal; split augmented Hammerstein behavioral model; CMOS technology; Circuit noise; Degradation; Frequency; Laboratories; Narrowband; Noise reduction; Power harmonic filters; Transceivers; Wireless sensor networks; Behavioral modeling; Hammerstein; distortion path; memory effects; power amplifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium (RWS), 2010 IEEE
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-4725-1
  • Electronic_ISBN
    978-1-4244-4726-8
  • Type

    conf

  • DOI
    10.1109/RWS.2010.5434121
  • Filename
    5434121