Title :
Iterative method for extracting impulse response of a RF channel with its band-limited transfer function
Author :
Luo, S. ; Chen, Z. ; Polu, N. ; Murillo, M.
Author_Institution :
Cape Breton Univ., Sydney, NS, Canada
Abstract :
Channel modeling is very important for wireless system designs, especially in a radio harsh environment. The impulse response is a key quantity that characterizes the time-domain properties of a RF channel. One of the conventional ways to obtain a channel impulse response is to measure the channel frequency-domain transfer function with a vector network analyzer and then convert the measured transfer function into its time-domain impulse response through the inverse Fourier transform. However, because the transfer function can practically be measured only within a finite frequency band, the obtained impulse response is often not causal and not very accurate with high resolutions. In this paper, we propose a Hilbert transform based iterative method to expand and extrapolate the transfer function beyond its measured frequency band and thus s highly-resolved causal impulse response of a RF channel can be obtained.
Keywords :
Fourier transforms; Hilbert transforms; iterative methods; network analysers; time-domain analysis; transfer functions; transient response; wireless channels; Hilbert transform based iterative method; RF channel; band-limited transfer function; channel frequency-domain transfer function; channel impulse response; channel modeling; finite frequency band; impulse response extraction; inverse Fourier transform; time-domain impulse response; time-domain properties; vector network analyzer; wireless system designs; Delay effects; Fourier transforms; Frequency domain analysis; Frequency measurement; Iterative methods; Pulse measurements; Radio frequency; Time domain analysis; Transfer functions; Wireless sensor networks; Hilbert transform; Impulse response; causality; iterative method; limited band; transfer function;
Conference_Titel :
Radio and Wireless Symposium (RWS), 2010 IEEE
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-4725-1
Electronic_ISBN :
978-1-4244-4726-8
DOI :
10.1109/RWS.2010.5434124