Title :
Efficient electro-thermal co-analysis on CPU+GPU heterogeneous architecture
Author :
Kun, Huang ; Xu, Yang ; Guoxing, Zhao ; Zuying, Luo
Author_Institution :
Coll. of Inf. Sci. & Technol., Beijing Normal Univ., Beijing, China
Abstract :
Since supply voltage and temperature (V&T) directly influence IC performance and reliability, electro-thermal (ET) analysis including power/ground (P/G) analysis and thermal analysis is very important in IC design. On the observation that temperature´s influence on leakage current (ET coupling effect) and supply voltage´s influence on power consumption, this work proposes a novel iteration-based ET co-analysis method that simultaneously solves V&T and then with them to refresh power consumption for the next round of V&T solving. Different from present methods that regard the P/G analysis and thermal analysis as independent processes without interaction, the ET co-analysis method takes their interaction into the consideration, which leads to more practical results. Since both P/G analysis and thermal analysis are very time-consuming, this work further employs multi-thread and GPU parallel computing techniques to speed up the ET co-analysis based on a parallel computing system of CPU+GPU heterogeneous architecture (PCS_CGHA). Experimental results show that compared with our method, present ET analysis methods will give too pessimistic or optimistic results W/O considering ET coupling effect. And our efficient method on PCS_CGHA provides 44 times speedup over the naive analysis method with no acceleration.
Keywords :
electronic engineering computing; graphics processing units; integrated circuit design; integrated circuit reliability; leakage currents; multi-threading; parallel processing; power consumption; power supply circuits; thermal analysis; CPU+GPU heterogeneous architecture; ET analysis; ET coupling effect; GPU parallel computing techniques; IC design; IC performance; IC reliability; P/G analysis; PCS_CGHA; V&T solving; electro-thermal analysis; electro-thermal co-analysis; independent processes; iteration-based ET co-analysis method; leakage current; multithread techniques; naive analysis method; parallel computing system; power consumption; power/ground analysis; supply voltage; temperature; Absorption; Algorithm design and analysis; Equations; Graphics processing unit; Instruction sets; Power demand; Thermal analysis; Algorithm; Electro-thermal Analysis; P/G Analysis; Parallel Computing; Thermal Analysis;
Conference_Titel :
Quality Electronic Design (ISQED), 2012 13th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4673-1034-5
DOI :
10.1109/ISQED.2012.6187519