• DocumentCode
    1892221
  • Title

    Memory fading Volterra series model for high power infrastructure amplifiers

  • Author

    Staudinger, Joseph ; Nanan, Jean-Christophe ; Wood, John

  • Author_Institution
    Freescale Semicond., Tempe, AZ, USA
  • fYear
    2010
  • fDate
    10-14 Jan. 2010
  • Firstpage
    184
  • Lastpage
    187
  • Abstract
    This paper presents a novel technique of adapting the generalized Volterra series behavioral model to describe, with improved accuracy, power amplifiers targeting cellular infrastructure applications. The generalized Volterra series is reformulated with respect to the discrete time domain to allow impendent specification of memory depth for each kernel. A memory fading concept is then adopted to align memory depth to increasing kernel order. The number of Volterra coefficients needed to represent a strong PA non-linearity are significantly reduced (to a manageable level), while retaining certain high order kernels essential for realizing exceptional model fidelity. Results show model residuals better than -60 dBc for single- and two-carrier WCDMA signals when applied to a 350 W LDMOS Doherty power amplifier circuit.
  • Keywords
    MOSFET; Volterra series; code division multiple access; power amplifiers; LDMOS Doherty power amplifier circuit; Volterra coefficients; cellular infrastructure; discrete time domain; generalized Volterra series behavioral model; high power infrastructure amplifiers; memory fading volterra series model; power 350 W; single-carrier WCDMA signals; two-carrier WCDMA signals; Circuits; Fading; High power amplifiers; Kernel; Multiaccess communication; Power amplifiers; Power system modeling; Radiofrequency amplifiers; Semiconductor optical amplifiers; Transmitters; Doherty power amplifier; Volterra series; digital pre-distortion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium (RWS), 2010 IEEE
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-4725-1
  • Electronic_ISBN
    978-1-4244-4726-8
  • Type

    conf

  • DOI
    10.1109/RWS.2010.5434137
  • Filename
    5434137