DocumentCode
1892279
Title
Analysis and redesign of RF filter bar to relieve thermal stresses
Author
Schmenk, E.G. ; Kelly, K.W. ; Saile, V. ; Bluem, H.P.
Author_Institution
Dept. of Mech. Eng., Louisiana State Univ., Baton Rouge, LA, USA
Volume
4
fYear
1995
fDate
1-5 May 1995
Firstpage
2141
Abstract
During operation of the electron storage ring at the Center for Advanced Microstructures and Devices (CAMD), high thermal stresses were induced in RF filter bars, causing the bars to deflect into the path of the emitted beams. Finite-element models (FEMs) were developed to model both the original and alternate RF filter bar designs. An improved filter bar design was implemented
Keywords
accelerator RF systems; electron accelerators; filters; finite element analysis; radiofrequency filters; storage rings; thermal stresses; CAMD electron storage ring; RF filter bar redesign; finite-element models; thermal stresses relief; Bars; Filters; Personnel; Predictive models; Radio frequency; Steady-state; Synchrotron radiation; Temperature; Tensile stress; Thermal stresses;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1995., Proceedings of the 1995
Conference_Location
Dallas, TX
Print_ISBN
0-7803-2934-1
Type
conf
DOI
10.1109/PAC.1995.505481
Filename
505481
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