Title :
Analysis and redesign of RF filter bar to relieve thermal stresses
Author :
Schmenk, E.G. ; Kelly, K.W. ; Saile, V. ; Bluem, H.P.
Author_Institution :
Dept. of Mech. Eng., Louisiana State Univ., Baton Rouge, LA, USA
Abstract :
During operation of the electron storage ring at the Center for Advanced Microstructures and Devices (CAMD), high thermal stresses were induced in RF filter bars, causing the bars to deflect into the path of the emitted beams. Finite-element models (FEMs) were developed to model both the original and alternate RF filter bar designs. An improved filter bar design was implemented
Keywords :
accelerator RF systems; electron accelerators; filters; finite element analysis; radiofrequency filters; storage rings; thermal stresses; CAMD electron storage ring; RF filter bar redesign; finite-element models; thermal stresses relief; Bars; Filters; Personnel; Predictive models; Radio frequency; Steady-state; Synchrotron radiation; Temperature; Tensile stress; Thermal stresses;
Conference_Titel :
Particle Accelerator Conference, 1995., Proceedings of the 1995
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-2934-1
DOI :
10.1109/PAC.1995.505481
