DocumentCode :
1892371
Title :
Viscous energy dissipation in laterally oscillating planar microstructures: a theoretical and experimental study
Author :
Cho, Young-Ho ; Kwak, Byung Man ; Pisano, Albert P. ; Howe, Roger T.
Author_Institution :
Mech. Eng. Res. Inst., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fYear :
1993
fDate :
7-10 Feb 1993
Firstpage :
93
Lastpage :
98
Abstract :
The authors investigate energy loss in an incompressible, viscous fluid layer that provides skin-friction damping for a laterally oscillating planar microstructure. The physical model for the viscous dissipation is based on Stokes-type fluid motion. In the theoretical analysis, the damping property of a fluid layer is characterized in terms of viscous energy dissipation, resulting in damping formulas for practical Q estimation. In the experimental study, surface-micromachined polysilicon resonators have been fabricated and tested under an electrostatic excitation in atmosphere. The estimated Q compares well with the Q measured for the test structures, as well as with the experimental Q reported by previous investigators. It is concluded that the Stokes-type damping model presents a more general damping treatment with better Q estimation, although discrepancies of 10 to 20% still remain between the estimated and measured Q. Possible sources of these discrepancies are discussed. The results of the study are applicable to damping design for microsensors and microactuators
Keywords :
damping; electric actuators; electric sensing devices; micromechanical devices; MEMS; Q-estimation; Si; Stokes-type fluid motion; damping design; electrostatic excitation; elemental semiconductor; incompressible; laterally oscillating planar microstructures; microactuators; microsensors; physical model; skin-friction damping; surface-micromachined polysilicon resonators; viscous energy dissipation; viscous fluid layer; Atmosphere; Atmospheric measurements; Atmospheric modeling; Damping; Electrostatic measurements; Energy dissipation; Energy loss; Microstructure; Q measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 1993, MEMS '93, Proceedings An Investigation of Micro Structures, Sensors, Actuators, Machines and Systems. IEEE.
Conference_Location :
Fort Lauderdale, FL
Print_ISBN :
0-7803-0957-X
Type :
conf
DOI :
10.1109/MEMSYS.1993.296959
Filename :
296959
Link To Document :
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