Title :
2005 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No. 05TH8806)
Abstract :
The following topics are dealt with: microprocessor building blocks and clocking; advanced memory device technology; advanced IC design and integration; advanced materials; process induced damage; ultra-thin gate; design for manufacturability and statistical approach; advanced transistor structure; low power and process monitoring.
Keywords :
clocks; design for manufacture; integrated circuit design; memory architecture; microprocessor chips; advanced materials; advanced memory device technology; advanced transistor structure; clocking; design for manufacturability; integrated circuit design; low power design; microprocessor building blocks; process induced damage; process monitoring; statistical approach; ultra-thin gate;
Conference_Titel :
Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-7803-9081-4
DOI :
10.1109/ICICDT.2005.1502569
