DocumentCode
1892424
Title
2005 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No. 05TH8806)
fYear
2005
fDate
9-11 May 2005
Abstract
The following topics are dealt with: microprocessor building blocks and clocking; advanced memory device technology; advanced IC design and integration; advanced materials; process induced damage; ultra-thin gate; design for manufacturability and statistical approach; advanced transistor structure; low power and process monitoring.
Keywords
clocks; design for manufacture; integrated circuit design; memory architecture; microprocessor chips; advanced materials; advanced memory device technology; advanced transistor structure; clocking; design for manufacturability; integrated circuit design; low power design; microprocessor building blocks; process induced damage; process monitoring; statistical approach; ultra-thin gate;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
Conference_Location
Austin, TX, USA
Print_ISBN
0-7803-9081-4
Type
conf
DOI
10.1109/ICICDT.2005.1502569
Filename
1502569
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