DocumentCode :
1892472
Title :
Self-consistent electrothermal Monte Carlo modeling of nanowire MISFETs
Author :
Sadi, Toufik ; Thobel, Jean-Luc ; Dessenne, François ; Dalle, Christophe
Author_Institution :
Dept. of Solid-State Electron., Tech. Univ. Ilmenau, Ilmenau, Germany
fYear :
2010
fDate :
26-29 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, we present a newly developed finite-element-based three-dimensional electrothermal Monte Carlo simulator, suitable for the study of a wide variety of nanodevices including nanowire-based structures. By relying on phonon statistics, electrothermal effects are accounted for through the coupling of an ensemble Monte Carlo trajectory simulation with the solution of the heat diffusion equation. The simulation model, which is suitably calibrated with experimental data, is employed to investigate carrier transport, and heat generation and transfer in metal-insulator field-effect transistors (MISFETs) based on a single InAs nanowire channel.
Keywords :
MISFET; Monte Carlo methods; indium compounds; nanowires; semiconductor device models; heat diffusion equation; metal-insulator field-effect transistors; nanowire MISFET; self-consistent electrothermal Monte Carlo modeling; Heating; Logic gates; MISFETs; Mathematical model; Monte Carlo methods; Nanoscale devices; Solid modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Electronics (IWCE), 2010 14th International Workshop on
Conference_Location :
Pisa
Print_ISBN :
978-1-4244-9383-8
Type :
conf
DOI :
10.1109/IWCE.2010.5677970
Filename :
5677970
Link To Document :
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