• DocumentCode
    1892472
  • Title

    Self-consistent electrothermal Monte Carlo modeling of nanowire MISFETs

  • Author

    Sadi, Toufik ; Thobel, Jean-Luc ; Dessenne, François ; Dalle, Christophe

  • Author_Institution
    Dept. of Solid-State Electron., Tech. Univ. Ilmenau, Ilmenau, Germany
  • fYear
    2010
  • fDate
    26-29 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, we present a newly developed finite-element-based three-dimensional electrothermal Monte Carlo simulator, suitable for the study of a wide variety of nanodevices including nanowire-based structures. By relying on phonon statistics, electrothermal effects are accounted for through the coupling of an ensemble Monte Carlo trajectory simulation with the solution of the heat diffusion equation. The simulation model, which is suitably calibrated with experimental data, is employed to investigate carrier transport, and heat generation and transfer in metal-insulator field-effect transistors (MISFETs) based on a single InAs nanowire channel.
  • Keywords
    MISFET; Monte Carlo methods; indium compounds; nanowires; semiconductor device models; heat diffusion equation; metal-insulator field-effect transistors; nanowire MISFET; self-consistent electrothermal Monte Carlo modeling; Heating; Logic gates; MISFETs; Mathematical model; Monte Carlo methods; Nanoscale devices; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics (IWCE), 2010 14th International Workshop on
  • Conference_Location
    Pisa
  • Print_ISBN
    978-1-4244-9383-8
  • Type

    conf

  • DOI
    10.1109/IWCE.2010.5677970
  • Filename
    5677970