DocumentCode :
1892517
Title :
The c-axis and a-axis orientations in InN grown directly on (0001) sapphire substrate by rf-MBE
Author :
Yamaguchi, T. ; Saito, Y. ; Kano, K. ; Araki, T. ; Teraguchi, N. ; Suzuki, A. ; Nanishi, Y.
Author_Institution :
Dept. of Photonics, Ritsumeikan Univ., Shiga, Japan
fYear :
2002
fDate :
2002
Firstpage :
643
Lastpage :
646
Abstract :
InN films were grown on (0001) sapphire substrates by radio-frequency plasma-excited molecular beam epitaxy. Even without the initial growth processing, which includes substrate nitridation and buffer layer deposition, the c-axis orientation in InN films was well controlled by increasing the growth temperature but keeping the temperature below the InN dissociation temperature. However, without initial growth processing, the a-axis orientation in InN films tended to have various rotation domains within the c-plane. Hence, the initial growth processes of substrate nitridation and buffer layer deposition were useful and effective ways to control the rotation domains.
Keywords :
III-V semiconductors; domains; indium compounds; molecular beam epitaxial growth; nitridation; semiconductor epitaxial layers; semiconductor growth; wide band gap semiconductors; (0001) sapphire substrate; Al2O3; InN; InN film; RF plasma-excited MBE growth; a-axis orientation; buffer layer deposition; c-axis orientation; rotation domain; substrate nitridation; Buffer layers; Molecular beam epitaxial growth; Optical films; Optical reflection; Plasma temperature; Radio frequency; Semiconductor films; Semiconductor process modeling; Substrates; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials Conference, 2002. IPRM. 14th
ISSN :
1092-8669
Print_ISBN :
0-7803-7320-0
Type :
conf
DOI :
10.1109/ICIPRM.2002.1014593
Filename :
1014593
Link To Document :
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