• DocumentCode
    1892517
  • Title

    The c-axis and a-axis orientations in InN grown directly on (0001) sapphire substrate by rf-MBE

  • Author

    Yamaguchi, T. ; Saito, Y. ; Kano, K. ; Araki, T. ; Teraguchi, N. ; Suzuki, A. ; Nanishi, Y.

  • Author_Institution
    Dept. of Photonics, Ritsumeikan Univ., Shiga, Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    643
  • Lastpage
    646
  • Abstract
    InN films were grown on (0001) sapphire substrates by radio-frequency plasma-excited molecular beam epitaxy. Even without the initial growth processing, which includes substrate nitridation and buffer layer deposition, the c-axis orientation in InN films was well controlled by increasing the growth temperature but keeping the temperature below the InN dissociation temperature. However, without initial growth processing, the a-axis orientation in InN films tended to have various rotation domains within the c-plane. Hence, the initial growth processes of substrate nitridation and buffer layer deposition were useful and effective ways to control the rotation domains.
  • Keywords
    III-V semiconductors; domains; indium compounds; molecular beam epitaxial growth; nitridation; semiconductor epitaxial layers; semiconductor growth; wide band gap semiconductors; (0001) sapphire substrate; Al2O3; InN; InN film; RF plasma-excited MBE growth; a-axis orientation; buffer layer deposition; c-axis orientation; rotation domain; substrate nitridation; Buffer layers; Molecular beam epitaxial growth; Optical films; Optical reflection; Plasma temperature; Radio frequency; Semiconductor films; Semiconductor process modeling; Substrates; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials Conference, 2002. IPRM. 14th
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-7320-0
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2002.1014593
  • Filename
    1014593