Title :
InP based material for long wavelength optoelectronics grown in a 24×2" (8×4") multiwafer Planetary Reactor® for mass production
Author :
Christiansen, K. ; Hofeldt, J. ; Dauelsberg, M. ; Deufel, M. ; Heuken, M. ; Juergensen, H.
Author_Institution :
Aixtron AG, Aachen, Germany
Abstract :
In order to increase the throughput in the production of long wavelength optoelectronics devices there is a growing demand for InP based materials to be grown in multiwafer reactors. In this paper we will present reactor simulations and results of the growth of InP based material in a Planetary Reactor®. The reactor that has been used was an AIX 2600G3 system in the 8×4" (24×2") configuration. Based on modeling results we achieved an excellent temperature distribution in the reaction chamber resulting in very good thickness and doping uniformity confirmed by XRD diffraction and Hall-effect measurements on the wafers meeting the specifications of the optoelectronics industry.
Keywords :
Hall effect; III-V semiconductors; MOCVD; X-ray diffraction; indium compounds; optoelectronic devices; temperature distribution; vapour phase epitaxial growth; AIX 2600G3 system; Hall-effect measurements; InP; MOCVD; XRD diffraction; doping uniformity; long wavelength optoelectronics; mass production; multiwafer Planetary Reactor; reactor simulations; temperature distribution; throughput; Doping; Indium phosphide; Inductors; Mass production; Optoelectronic devices; Semiconductor device modeling; Semiconductor process modeling; Temperature distribution; Throughput; X-ray scattering;
Conference_Titel :
Indium Phosphide and Related Materials Conference, 2002. IPRM. 14th
Print_ISBN :
0-7803-7320-0
DOI :
10.1109/ICIPRM.2002.1014599