• DocumentCode
    1892790
  • Title

    Stable electrodes and ultrathin passivation coatings for high temperature sensors in harsh environments

  • Author

    Frankel, D.J. ; Bernhardt, G.P. ; Sturtevant, B.T. ; Moonlight, T. ; Cunha, M. Pereira da ; Lad, R.J.

  • Author_Institution
    Lab. for Surface Sci. & Technol., Univ. of Maine, Orono, ME
  • fYear
    2008
  • fDate
    26-29 Oct. 2008
  • Firstpage
    82
  • Lastpage
    85
  • Abstract
    Sensor operation in harsh environments up to 1000degC requires robust packages including stable electrodes and protective coatings. We have developed nanostructured ultra-thin (< 100 nm) Pt-10%Rh / ZrO2 electrode structures grown by e-beam co-evaporation that operate at temperatures approaching 1000degC. X-ray diffraction (XRD), resistivity, and electron microscopy (EM) studies indicate incorporation of ZrO2 within the film delays recrystallization, maintaining a stable morphology. We have also developed ultra-thin (< 50 nm) SiAlON passivation coatings that mechanically protect the sensor surfaces, yet allow interaction with the environment. Different SiAlON stoichiometeries were produced by rf magnetron sputtering of Al and Si targets in O2/N2/Ar mixtures. The SiAlON films are amorphous and extremely smooth (< 1 nm rms) and remain so even after extended annealing at 1000degC. Our results are applicable to a wide range of high temperature sensor configurations.
  • Keywords
    X-ray diffraction; aluminium compounds; electrodes; electron microscopy; passivation; sensors; silicon compounds; sputter deposition; zirconium compounds; SiAlON; X-ray diffraction; ZrO2; e-beam co-evaporation; electron microscopy studies; harsh environments; high temperature sensors; nanostructured ultra-thin electrode structures; protective coatings; rf magnetron sputtering; sensor operation; sensor surfaces; stable electrodes; temperature 1000 C; ultrathin passivation coatings; Coatings; Conductivity; Electrodes; Packaging; Passivation; Protection; Robustness; Temperature sensors; X-ray diffraction; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2008 IEEE
  • Conference_Location
    Lecce
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-2580-8
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2008.4716388
  • Filename
    4716388