DocumentCode
1892804
Title
International Electron Devices Meeting. IEDM Technical Digest [Front Matter and Table of Contents]
fYear
1997
fDate
10-10 Dec. 1997
Abstract
Presents front matter and table of contents from the conference proceedings.
Keywords
semiconductor devices; CMOS devices; compound semiconductors; detectors; displays; electron devices; integrated circuits; interconnect technology; modeling; quantum electronics; reliability; sensors; simulation; solid state devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location
Washington, DC, USA
ISSN
0163-1918
Print_ISBN
0-7803-4100-7
Type
conf
DOI
10.1109/IEDM.1997.649430
Filename
649430
Link To Document