Title :
International Electron Devices Meeting. IEDM Technical Digest [Front Matter and Table of Contents]
Abstract :
Presents front matter and table of contents from the conference proceedings.
Keywords :
semiconductor devices; CMOS devices; compound semiconductors; detectors; displays; electron devices; integrated circuits; interconnect technology; modeling; quantum electronics; reliability; sensors; simulation; solid state devices;
Conference_Titel :
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-4100-7
DOI :
10.1109/IEDM.1997.649430
