Title :
A stable marching-on-in-time solver for time domain surface electric field integral equations based on exact integration technique
Author :
Shi, Yifei ; Xia, Ming-Yao ; Chen, Ru-Shan ; Michielssen, Eric ; Lu, Mingyu
Author_Institution :
Nanjing Univ. of Sci. & Technol., Nanjing, China
Abstract :
Theoretical studies and experience confirm that the stability of marching-on-in-time (MOT) solvers pertinent to the analysis of scattering from free-standing threedimensional perfect electrically conducting (PEC) surfaces hinges on the accurate evaluation of the MOT matrix elements resulting from a Galerkin discretization of the underlying integral equation. Unfortunately, accurate evaluation of the four-dimensional spatial integrals called for is prohibitively expensive when performed by numerical means. To mitigate this cost, two-dimensional integrals over source coordinates are evaluated analytically while the remaining two-dimensional integration over testing coordinates is carried out numerically; the technique assumes the use of Rao-Wilton-Glisson (RWG) spatial basis functions and Lagrange polynomial temporal expansions. While the MOT solver was shown to be stable for a wide range of problems involving up to 50,000 time steps, subsequent studies have revealed instabilities for small time steps.
Keywords :
Galerkin method; electric field integral equations; integration; numerical stability; time-domain analysis; Galerkin discretization; Lagrange polynomial temporal expansions; MOT matrix elements; Rao-Wilton-Glisson spatial basis functions; exact integration technique; four-dimensional spatial integrals; free-standing three-dimensional perfect electrically conducting surfaces; source coordinates; stability; stable marching-on-in-time solver; testing coordinates; time domain surface electric field integral equations; two-dimensional integrals; two-dimensional integration; Correlation; Electric fields; Finite element methods; Integral equations; Scattering; Stability analysis; Time domain analysis;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2010 IEEE
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-4967-5
DOI :
10.1109/APS.2010.5561870