Title :
InN nanowire based sensors
Author :
Koley, Goutam ; Cai, Zhihua
Author_Institution :
Dept. of Electr. Eng., Univ. of South Carolina, Columbia, SC
Abstract :
High quality InN nanowires (NWs) were grown from nanoscale catalyst patterns by vapor-liquid-solid mechanism. The nanowires bend spontaneously or get deflected from other nanowires at multiples of 30deg forming nano-networks. Smooth and planar NWs used to fabricate field effect transistors (FET) exhibited excellent drain current modulation in a back-gated geometry. The mobility calculated from the I-V characteristics is 36 cm2/Vs, while the carrier concentration is 4.8times1018 cm-3. The NW FET based nanosensor demonstrated high sensitivity to trace NO2 due to a thin In2O3 shell layer present around the InN core. The adsorption of the NO2 molecules reduces the density of the carriers confined at the InN/In2O3 interface, thus reducing the drain current. The change in drain current for a single NW based FET resulted in a very high sensitivity of 45 ppb in ambient conditions. Planar InN nano-networks can potentially offer a much improved sensitivity to trace NO2 in ambient conditions.
Keywords :
III-V semiconductors; adsorption; carrier density; catalysts; electron mobility; field effect transistors; gas sensors; indium compounds; nanofabrication; nanowires; semiconductor thin films; wide band gap semiconductors; FET; I-V characteristics; InN-In2O3; NW fabrication; adsorption; back-gated geometry; carrier concentration; carrier density; drain current modulation; electron mobility; field effect transistors; nanoscale catalyst patterns; nanowire based sensors; thin shell layer; vapor-liquid-solid mechanism; FETs; Geometry; Gold; III-V semiconductor materials; Nanoscale devices; Photonic band gap; Scanning electron microscopy; Semiconductivity; Substrates; Welding;
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2008.4716397