• DocumentCode
    1893242
  • Title

    A method for estimating the IMD performance requirements of circuit blocks in the error signal path of an envelope feedback amplifier

  • Author

    Constantin, N.G. ; El-Gamal, M.N.

  • Author_Institution
    Ecole de Technol. Super., Montreal, QC, Canada
  • fYear
    2010
  • fDate
    10-14 Jan. 2010
  • Firstpage
    252
  • Lastpage
    255
  • Abstract
    This paper presents an equations based approach for estimating the linearity requirements for the RF envelope detectors and the other circuit blocks typically found in the error signal path of an envelope feedback amplifier. The proposed equations are based on a three-tone excitation and a 5th degree power series representation of the nonlinearities in the RF power amplifier block, which allows estimating inter-modulation distortion within the feedback system using peak-to-average envelope voltage ratios that may be parameterized. The proposed approach for validating and optimizing the linearity performances of the envelope detectors in open loop conditions, as a function of feedback parameters and closed loop IMD goals, can be used to analyze envelope feedback systems during the design phase, and may be particularly helpful for circuit characterization independently of the simulation environment.
  • Keywords
    feedback amplifiers; intermodulation distortion; power amplifiers; radiofrequency amplifiers; IMD performance requirements; RF envelope detectors; RF power amplifier block; circuit blocks; closed loop IMD goals; envelope feedback amplifier; error signal path; estimation method; intermodulation distortion; three-tone excitation; Envelope detectors; Feedback amplifiers; Feedback circuits; Feedback loop; Linearity; Nonlinear equations; Power amplifiers; RF signals; Radio frequency; Radiofrequency amplifiers; Amplifiers; envelope feedback; hardware reconfiguration; inter-modulation; linearity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium (RWS), 2010 IEEE
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    978-1-4244-4725-1
  • Electronic_ISBN
    978-1-4244-4726-8
  • Type

    conf

  • DOI
    10.1109/RWS.2010.5434185
  • Filename
    5434185