DocumentCode :
1893276
Title :
Simplified calculation method of electron subband profile in ballistic nanowire MOSFET
Author :
Numata, Tatsuhiro ; Uno, Shigeyasu ; Nakazato, Kazuo ; Sawicka, Anna ; Nikov, Gennady Mil ; Kamakura, Yoshinari ; Mori, Nobuya
Author_Institution :
Dept. of Electr. & Comput. Sci., Nagoya Univ., Nagoya, Japan
fYear :
2010
fDate :
26-29 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
We develop a simple method to calculate the electron subband profiles, which represent distributions of each discrete energy level along the channel, in a nanowire metal-oxide-semiconductor field-effect-transistor. The electrostatic potential distribution in the wire cross section is approximated by a quadratic function with a correction due to the depletion layer that spreads into the channel from the source and drain. The Schrodinger equation is solved analytically to derive the subbands, and their profiles are determined by numerically solving the coupled equation of charge densities derived from electrostatics or quantum mechanics. The obtained subband profiles are compared with simulation results calculated from the non-equilibrium Green´s function method, and our method demonstrates good accuracy. Using the Landauer formula with transmission probability calculated from the subband profiles, we finally calculate the drain current that shows good agreement with the simulation results.
Keywords :
Green´s function methods; MOSFET; Schrodinger equation; ballistics; nanoelectronics; nanowires; probability; Landauer formula; Schrodinger equation; ballistic nanowire MOSFET; charge density; depletion layer; discrete energy level; electron subband profile; electrostatic potential distribution; nanowire metal-oxide-semiconductor field-effect-transistor; nonequilibrium Green´s function method; quadratic function; quantum mechanics; transmission probability; wire cross section; Accuracy; Electric potential; Electrostatics; Equations; Logic gates; Mathematical model; Tunneling; Nanowire MOSFET; ballistic current; subband profile; transmission probability; tunneling current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Electronics (IWCE), 2010 14th International Workshop on
Conference_Location :
Pisa
Print_ISBN :
978-1-4244-9383-8
Type :
conf
DOI :
10.1109/IWCE.2010.5677999
Filename :
5677999
Link To Document :
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