Title :
Model-based resolution enhancement of a miniaturized ion mobility spectrometer
Author :
Barth, Sebastian ; Baether, Wolfgang ; Zimmermann, Stefan
Author_Institution :
Res. Unit, Draegerwerk AG & Co. KGaA, Lubeck
Abstract :
A numerical model has been used to study the effect of various design parameters on the resolution of our miniaturized ion mobility spectrometer (IMS). This multiphysics model is based on a finite element approach and gives a detailed insight into the convection and migration of gaseous ions in the spectrometer. It can be also applied to other aspiration condenser type IMS. As reported earlier, physical ion-ion and ion-molecule interactions are considered to achieve an adequate accuracy of the simulations. With good conformity between simulations and measurements, both resolution and simplicity of our design could be significantly improved. The optimized IMS can be used in cost and size-limited applications where chemical substances have to be identified at low ppb-level concentrations within seconds.
Keywords :
convection; finite element analysis; ion mobility; ion-molecule reactions; aspiration condenser; convection; finite element analysis; gaseous ion migration; ion-ion interaction; ion-molecule interaction; miniaturized ion mobility spectrometer; model-based resolution enhancement; Chemical compounds; Chemical industry; Chemical sensors; Cost function; Finite element methods; Instruments; Numerical models; Shape measurement; Signal resolution; Spectroscopy;
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2008.4716413