A Dutch-US microelectronic collaboration

Author

Van Slooten, Jesse ; Witteveen, Frank J F M ; De Gruijter, Robin ; Gunnewiek, Rene K. ; Bijker, H.J. ; Pearson, Robert E. ; Fuller, Lynn F.

Author_Institution

Dept. of Electron., Hogesch. Enschede, Netherlands

fYear

1993

fDate

18-19 May 1993

Firstpage

166

Lastpage

169

Abstract

The interaction between a European educational institution, i.e., the Electrical Engineering Department of the Hogeschool Enschede (HE), in the Netherlands and the Microelectronic Engineering Department of the Rochester Institute of Technology (RIT) in the US is described. Six students from the Netherlands have come to the US to complete a thesis for graduation from Hogeschool Enschede. One student conducted a six-month project on the design, simulation, fabrication, and testing of CMOS circuits. These institutions are described, together with the student´s project

Keywords

CMOS integrated circuits; education; integrated circuit technology; project engineering; CMOS circuits; Dutch-US microelectronic collaboration; QuickSim simulation; boundary scan circuit design; education; fabrication; simulation; testing; Art; Circuit simulation; Circuit testing; Collaboration; Educational institutions; Educational programs; Educational technology; Electrical engineering; Fabrication; Microelectronics;

fLanguage

English

Publisher

ieee

Conference_Titel

University/Government/Industry Microelectronics Symposium, 1993., Proceedings of the Tenth Biennial

Conference_Location

Research Triangle Park, NC

ISSN

0749-6877

Print_ISBN

0-7803-0990-1

Type

conf

DOI

10.1109/UGIM.1993.297014

Filename

297014