DocumentCode :
1893525
Title :
Manufacturability-aware physical layout optimizations
Author :
Pan, David Z. ; Wong, Martin D F
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
fYear :
2005
fDate :
9-11 May 2005
Firstpage :
149
Lastpage :
153
Abstract :
Nanometer VLSI design is greatly challenged by the growing interdependency between manufacturing and design. Existing approaches in design for manufacturability (DFM) are still mostly post design, rather than during design. To really bridge the gap between design and manufacturing, it is important to model and feed proper manufacturing metrics and cost function upstream, especially at the key physical layout optimization stages such as routing and placement to have major impacts. In this paper, the authors show several aspects of the true manufacturability-aware physical design from lithography-aware routing to redundant-via aware routing to CMP aware floor planning and placement, and show their promises.
Keywords :
VLSI; circuit optimisation; design for manufacture; lithography; VLSI design; design for manufacturability; lithography-aware routing; manufacturability-aware physical layout optimizations; placement; redundant-via aware routing; Bridges; Cost function; Design for manufacture; Design optimization; Feeds; Pulp manufacturing; Routing; Very large scale integration; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
Print_ISBN :
0-7803-9081-4
Type :
conf
DOI :
10.1109/ICICDT.2005.1502616
Filename :
1502616
Link To Document :
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