• DocumentCode
    1893870
  • Title

    SOI partially-depleted ultra low voltage memory and digital circuit design

  • Author

    Thomas, Olivier ; Amara, Ainara ; Valentian, Alexandre

  • Author_Institution
    CEA/LETI, Grenoble, France
  • fYear
    2005
  • fDate
    9-11 May 2005
  • Firstpage
    211
  • Lastpage
    215
  • Abstract
    In this paper the authors investigated design techniques for ultra low voltage (ULV) SRAM and digital circuits based on partially-depleted silicon on insulator (SOI) devices. A systematic design methodology dedicated to SRAM memory cells is presented, it takes into account the floating body effect at different levels of the design process. This methodology is used to design a new 4 transistors self-refresh memory cell and results are compared to the 6 transistors one. ULV digital circuits, ranging from basic gates to a complex wavelet transform are investigated. It is shown that for 130nm SOI partially-depleted technology that using high-speed transistors leads to a significant speed improvement and power saving. The power-delay product is improved by a factor of 2.4.
  • Keywords
    SRAM chips; cellular arrays; high-speed integrated circuits; integrated circuit design; low-power electronics; silicon-on-insulator; 130 nm; SOI; SRAM memory cells; digital circuit design; floating body effect; high speed transistors; partially depleted ultra low voltage memory; self refresh memory cell; wavelet transform; CMOS technology; Design methodology; Digital circuits; Leakage current; Low voltage; Pacemakers; Power supplies; Random access memory; Silicon on insulator technology; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
  • Print_ISBN
    0-7803-9081-4
  • Type

    conf

  • DOI
    10.1109/ICICDT.2005.1502632
  • Filename
    1502632